GaN-based e-Beam Inspection and Metrology Co-developed by Startup Photo electron Soul Inc. and Nagoya University Will be Evaluated by Kioxia, a Leading Flash Memory Producer
It was announced today that GaN (Gallium Nitride)-based e-Beam inspection and metrology for advanced semiconductor manufacturing, jointly developed by Nagoya University startup Photo electron Soul Inc. (PeS; CEO: Takayuki Suzuki) and the Nagoya University Amano-Honda Laboratory, will be evaluated by Kioxia Iwate Corporation (President and CEO: Koichiro Shibayama) in late September. During the critical field test, Kioxia Iwate will evaluate and verify the benefits of adopting this advanced technology to improve overall manufacturing yield by enhancing defect detection and root-cause analysis within live inspection and metrology processes.
Photo electron Soul, Only Supplier of “Semiconductor Photocathode Electron Beam Technology”, Signs Capital and Business Partnership with USHIO
Photo electron Soul Inc. (Takayuki Suzuki CEO, hereafter “PeS”), a startup company launched by Nagoya University, announced today that it has raised 730 million yen from a group of general partners led by USHIO INC. (Koji Naito President & CEO, hereafter “USHIO”) and concluded a sole-distributor agreement with USHIO for the semiconductor photocathode e-beam generation systems incorporated into e-beam semiconductor wafer pattern inspection tools.
